Gamma过程退化失效可靠性分析

Stochastic Gamma Process Degradation Failure Analysis

摘要:

退化型失效产品,可通过退化失效分析对其进行可靠性统计推断。性能退化一般是一个随机过程,并且是单调变化的,为描述产品的退化,给出了一个随机Gamma过程模型,通过求解该过程的首达时分布即可获得产品的失效分布。由于解析方法求解存在很大的难度,给出了一种基于仿真的求解方法。利用所得模型对强激光装置所用的某型金属化膜脉冲电容器进行了可靠性分析,说明了模型的适用性。

Abstract:

As there exist quality characteristics that degradation over time can be related to reliability, reliability assessment from degradation measures is more effective than the traditional one. Because deterioration is uncertain over time, it should ideally be represented as a stochastic process. In this paper, a stochastic Gamma process model was presented to analyze the degradation failure process. Because it was difficult to obtain an analytical expression for the distribution of first passage time, a simulation method was represented to analyze the failure distribution. In the end, the methodology was demonstrated and validated in the reliability analysis of metallized film pulse capacitors.