Abstract:For predicting the lifetime of missile electrical connector, the approach of degradation data analysis based on Gamma model was accordingly proposed. Firstly, taking contact resistor as performance index,the per formance degradation data was gotten through accelerated degradation test, in which temperature and relative hu midity were accelerated stresses. Nextly, Gamma model was used to fit the degradation path,and then general ized eyring model was utilized to set up relationship between sample lifetimes and accelerated stresses. Lastly,with MLE method, the estimators of model parameters were obtained by integral statistics of all the performance degradation data. Furthermore, the lifetime of electrical connector was successfully predicted.